PRESENTATION: Single Event Metadata Analysis

Presented at the 2020 NEPP Electronics Technology Workshop: Work on using metadata of COTS electronics to model Single Event Latchup (SEL) radiation events. Also delves into using image segmentation in order to quantify cross section of various silicon componets as inputs to SEL prediction system.

You can find the presentation in it's entirety here: https://ntrs.nasa.gov/citations/20220001367